CCD-in-CMOS technology enables ultra-fast burst mode imaging

SI Sensors – a pioneering developer of advanced imaging technologies, is proud to announce a groundbreaking development in the field of high-speed imaging: the integration of Charge-Coupled Device (CCD) technology within Complementary Metal-Oxide-Semiconductor (CMOS) image sensors.

This innovative approach, known as CCD-in-CMOS, significantly enhances the capabilities of burst mode imaging, enabling ultra-fast capture speeds with unprecedented speed and sensitivity.

Developed at the company’s R&D facility in Cambridge, UK – the novel CCD-in-CMOS technological advance combines the best attributes of both CCD and CMOS sensors. CCDs provide an ability to store signal in the charge domain, prior to both voltage conversion and subsequent digitisation. It is these signal conversions which limit the frame capture speed of conventional image sensors. By comparison, CMOS technology advantageously enables system on chip architectures which integrate additional circuitry on the same chip, reducing the overall system cost and complexity. By integrating CCD memory with CMOS photodiodes and readout circuits, this hybrid technology achieves exceptional image quality at ultra-high speeds, making it ideal for applications requiring ultra-high speed image capture and analysis.

General Manager of SI Sensors – Phil Brown commented “We believe that our ability to create ultra-fast burst mode devices will revolutionise high speed imaging. Capable of recording at millions of frames per second with full resolution, this new generation of CCD-in-CMOS image sensors can provide exceptional capture speed with high signal-to-noise ratio, ensuring clear and detailed images of the fastest observable events. Adaptable to imaging applications ranging from high-speed video recording to hyperspectral imaging our CCD-in-CMOS technology enables efficient data handling through advanced in-situ storage, control and readout mechanisms that reduce system complexity”.

Custom CCD in CMOS image sensors on wafer

For further information on development of CCD-in-CMOS sensors optimised for your unique imaging application, please visit www.si-sensors.com or contact SI Sensors on +44 1442 827 728 / [email protected],

SI Sensors is dedicated to pushing the boundaries of imaging technology. With a focus on innovation and quality, the company aims to provide cutting-edge solutions that meet the evolving needs of its customers across various industries. A commitment to excellence drives SI Sensors to continuously develop advanced imaging technologies that enhance the way we see and understand the world.

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